Abstract: The application diversity and evolution of AI accelerator architectures require innovative DFT solutions to address issues such as test time, test power, performance and area overhead. Full ...
The industry's aspirations for machine learning are running ahead of the data plumbing required to support them.
The shift to HBM4 and HBM5 will increase the pressure for shift-left test flows. Taller high-bandwidth memory (HBM) stacks ...
A team led by researchers from Tokyo Metropolitan University, in collaboration with Tohoku University and Orbray Co., Ltd., ...
Abstract: As mm-wave phased-array and MIMO systems scale in complexity and integration, testing and ensuring their reliability becomes increasingly challenging. Traditional external test approaches ...
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