San Francisco, CA, July 26, 2023 (GLOBE NEWSWIRE) -- Zion Market Research has published a new research report titled “Automated Optical Inspection (AOI) Equipment Market By Industry (Aerospace & ...

Rochester Institute of Technology recently installed a MIRTEC MV3 OMNI automated, optical inspection machine in its Center for Electronics Manufacturing and Assembly (CEMA). The equipment enables ...

DUBLIN--(BUSINESS WIRE)--Research and Markets (http://www.researchandmarkets.com/research/a6094b/automated_optical) has announced the addition of the "Automated ...

Optical inspection equipment for packaging was displayed at INTERPHEX 2015. Demand remains high for quality-control technology, driven by high-profile recalls, revised guidelines like the United ...

Applied Materials has launched a new generation of optical semiconductor wafer inspection machines that incorporate big data and AI techniques. These multimillion-dollar machines are used in chip ...

Taiwan-based optical inspection equipment (AOI) supplier Utechzone expects to post impressive revenue growth this year, driven by robust demand from chipmaking and IC substrate clients that are ...

The wafer inspection business is heating up as chipmakers encounter new and tiny killer defects in advanced devices. Last month ASML Holding entered into an agreement to acquire Hermes Microvision ...

Veteran semiconductor equipment distributor Spirox has successfully entered the advanced packaging supply chain in the second half of 2025 with its self-developed advanced optical inspection equipment ...

Toshiba Electronics Europe has launched a new colour CCD linear image sensor aimed at improving the speed and accuracy of ...

The shift to multi-die assemblies is forcing changes in how chips are tested and inspected in order to achieve sufficient yield ramp or respond more quickly to yield excursions.

One high-volume OEM proves that even simple feedback from an AOI system can reduce end-of-line defects by an order of magnitude. Until recently, the use of pre-reflow optical inspection usually was ...